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Answer: Stuck-open fault – A transistor becomes permanently nonconducting due to some defect. – May require a sequence of test vectors for detection. – A combinational circuit can exhibit sequential behavior. Consider CMOS implementation of a 2 input (A,B as inputs) NOR gate where the PMOS transistors are T1 and T2, say. For detecting T1 stuck-open: – Apply a two pattern test. • First pattern: AB = 10 or 01 or 11 • Second pattern: AB = 00 – This test will also detect T2 stuck-open. • Two-vector s-op test can be constructed by ordering two stuck-at tests.

Answer: Can you please identify the slide number and line number in "Subject Name:VLSI Design Verification and Test Topic:Two level Boolean Logic Synthesis " Where you found "The maximum number of prime implicants of an n-variable lies between 2^n-1 and 3^n-1.why & how ?" We could not find that line in our slides. This would help us to answer your query.

Answer: Stuck-open fault – A transistor becomes permanently nonconducting due to some defect. – May require a sequence of test vectors for detection. – A combinational circuit can exhibit sequential behavior. Consider CMOS implementation of a 2 input (A,B as inputs) NOR gate where the PMOS transistors are T1 and T2, say. For detecting T1 stuck-open: – Apply a two pattern test. • First pattern: AB = 10 or 01 or 11 • Second pattern: AB = 00 – This test will also detect T2 stuck-open. • Two-vector s-op test can be constructed by ordering two stuck-at tests.